By Earl J. Kirkland
Advanced Computing in Electron Microscopy, 2d version, brings jointly diversified info on picture simulation. a useful source, this publication presents details on a variety of equipment for numerical computation of excessive solution traditional and scanning transmission electron microscope pictures. this article is going to function a useful tool for college students on the complex undergraduate or graduate point, in addition to skilled researchers within the box.
This stronger moment version contains:
-descriptions of recent advancements within the field
-additional fabric on aberration corrected tools and confocal electron microscopy
-expanded and stronger examples and sections to supply more desirable clarity
Read Online or Download Advanced Computing in Electron Microscopy PDF
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Extra info for Advanced Computing in Electron Microscopy
13A, B, Academic Press, 1980  8. V. K. Zworykin, G. A. Morton, E. G. Ramberg, J. Hillier, A. W. Vance, Electron Optics and the Electron Microscope, Wiley, 1945  Chapter 3 Linear Image Approximations Abstract This chapter presents approximations for simple calculation of CTEM and STEM (BF, ADF, and confocal) images using linear image models. A linear image is the convolution of an object function and the point spread function (multiplication in Fourier transform space). This can provide a simple intuitive approach to interpreting the electron micrographs although it might not be particularly accurate.
2 Partial Coherence in BF-CTEM 41 It is interesting to note that the cross term W3 produced the correction ε in the transfer function which can move the zero crossings in the transfer function but seems to have a negligible effect under Scherzer conditions. 7 Fig. 1 Aberration Correctors and Partial Coherence It is straight forward but somewhat tedious to add higher order aberrations to the earlier expressions for partial coherence. 25(πλ Δ0k2 )2 . 42) However, terms such as the spherical aberration coefficient Cs = CS3 are no longer really constant.
It is also not clear how fluctuations in the various aberration coefficient are coupled (mathematically in the aberration function and practically through common coils and currents). 3 Detector Influence (CTEM) The detector that records the image may itself have a large influence on the image quality. Currently, the detector is usually a CCD camera (plus scintillator). Film (or plates) were the most common detector in the not so distant past. It was common to record the image at not very high magnification and then magnify further in the darkroom enlarger, in which case the film may produce a large effect.